Problem 4.5
An atomic force microscope (AFM) is a state-of-the-art device used to study
the mechanical and topological properties of surfaces on length scales as small
as the size of individual atoms. The device uses a flexible cantilever beam
AB
with a very sharp, stiff tip
BC
that is brought into contact with the surface to
be studied. Due to contact forces at
C
, the cantilever beam deflects. If the tip
of the AFM is subjected to the forces shown, determine the resultant moment of
both forces about point A. Use both scalar and vector approaches.